A statistical test suite for random and pseudorandom number generators for cryptographic applications

E Bassham, Lawrence; L. Rukhin, Andrew; Soto, Juan; Nechvatal, James; E Smid, M; Barker, Emma; D. Leigh, Stefan; Levenson, Mark; Vangel, Márk; Banks, David; Alan Heckert, N.; F. Dray, James; Vo, San

doi:10.6028/nist.sp.800-22r1a

Public

A statistical test suite for random and pseudorandom number generators for cryptographic applications

Published • Jan 1, 2010

Authors:

Lawrence E Bassham

Andrew L. Rukhin

Juan Soto

Abstract

The Information Technology Laboratory (ITL) at the National Institute of Standards and Technology (NIST) promotes the U.S. economy and public welfare by providing technical leadership for the nation's measurement and standards infrastructure. ITL develops tests, test methods, reference data, proof o...

Subject

NIST

Implementation

Pseudorandom number generator

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