Impact of multiple-detect test patterns on product quality

Benware, Brady; Schuermyer, Chris; Tamarapalli, N.; Tsai, Kun-Han; Ranganathan, S.; Madge, R.; Rajski, J.; Krishnamurthy, P.

doi:10.1109/test.2003.1271091

Public

Impact of multiple-detect test patterns on product quality

Published • Jul 8, 2004

Authors:

Brady Benware

Chris Schuermyer

N. Tamarapalli

Abstract

This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizing the coverage of node-to-node bridging defects. Volume data obtained by testing a production ASIC with these new multip...

Subject

Automatic test pattern generation

Fault coverage

Robustness (evolution)

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