Thickness-dependent electronic structure of ultrathin SrRuO3 films studied by <i>in situ</i> photoemission spectroscopy

Toyota, D.; Ohkubo, I.; Kumigashira, Hiroshi; Oshima, M.; Ohnishi, Tsuyoshi; Lippmaa, Mikk; Takizawa, M.; Fujimori, A.; Ono, Kanta; Kawasaki, M.; Koinuma, Hideomi

doi:10.1063/1.2108123

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Thickness-dependent electronic structure of ultrathin SrRuO3 films studied by in situ photoemission spectroscopy

Published in Applied Physics Letters • Oct 10, 2005

Authors:

D. Toyota

I. Ohkubo

Hiroshi Kumigashira

Abstract

In situ thickness-dependent photoemission spectroscopy (PES) has been performed on SrRuO3 (SRO) layers deposited on SrTiO3 substrates to study the structure-induced evolution of the electronic structure. The PES spectra showing the existence of two critical film thicknesses reveal that a metal-insul...

Subject

Materials science

Photoemission spectroscopy

Monolayer

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