Analog and mixed-signal benchmark circuits-first release

Kamińska, Bożena; Arabi, K.; M. Bell, Ian; Goteti, Prashant; Huertas, J.L.; Kim, B.; Rueda, A.; Soma, M.

doi:10.1109/test.1997.639612

Public

Analog and mixed-signal benchmark circuits-first release

Published • Nov 22, 2002

Authors:

Bożena Kamińska

K. Arabi

Ian M. Bell

Abstract

The IEEE Mixed-Signal Technical Activity Committee is developing a common set of benchmark circuits for use in researching and evaluating analog fault modeling, test generation, design-for-test, and built-in self-test methodologies. The first release circuits are based on MITEL Semiconductor's 1.5 /...

Subject

Mixed-signal integrated circuit

Benchmark (surveying)

Analogue electronics

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