Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity

Dréau, A.; Lesik, Margarita; Rondin, Loïc; Spinicelli, Piernicola; Arcizet, O.; Roch, Jean-François; Jacques, V.

doi:10.1103/physrevb.84.195204

Public

Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity

Published in Physical Review B • Nov 23, 2011

Authors:

A. Dréau

Margarita Lesik

Loïc Rondin

Abstract

We report a systematic study of the magnetic field sensitivity of a magnetic sensor consisting of a single nitrogen-vacancy (NV) defect in diamond, by using continuous optically detected electron spin resonance (ESR) spectroscopy. We first investigate the behavior of the ESR contrast and linewidth a...

Subject

Laser linewidth

Sensitivity (control systems)

Magnetic field

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