High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies ... View More