Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

Ludwig, Wolfgang; Reischig, P.; King, A.; Herbig, Michael; Lauridsen, E.M.; Johnson, Graham; Marrow, T.J.; Buffière, J.Y.

doi:10.1063/1.3100200

Public

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

Published in Review of Scientific Instruments • Mar 1, 2009

Authors:

Wolfgang Ludwig

P. Reischig

A. King

Abstract

X-ray diffraction contrast tomography (DCT) is a technique for mapping grain shape and orientation in plastically undeformed polycrystals. In this paper, we describe a modified DCT data acquisition strategy which permits the incorporation of an innovative Friedel pair method for analyzing diffractio...

Subject

Diffraction

Materials science

X-ray crystallography

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