Landau Quantization and the Thickness Limit of Topological Insulator Thin Films of Sb 2 Te 3

Jiang, Yeping; Wang, Yilin; Chen, Mu; Li, Zhi; Song, Can‐Li; He, Ke; Wang, Lili; Chen, Xi; Ma, Xu-Cun; Xue, Qi‐Kun

doi:10.1103/physrevlett.108.016401

Public

Landau Quantization and the Thickness Limit of Topological Insulator Thin Films of Sb 2 Te 3

Published in Physical Review Letters • Jan 3, 2012

Authors:

Yeping Jiang

Yilin Wang

Mu Chen

Abstract

We report the experimental observation of Landau quantization of molecular beam epitaxy grown Sb{2}Te{3} thin films by a low-temperature scanning tunneling microscope. Different from all the reported systems, the Landau quantization in a Sb{2}Te{3} topological insulator is not sensitive to the intri...

Subject

Quantization (signal processing)

Topological insulator

Physics

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