On the measurement of critical micelle concentrations of pure and technical‐grade nonionic surfactants

Patist, A.; S. Bhagwat, Sunil; Penfield, Kevin; A. Aikens, Patricia; O. Shah, D.

doi:10.1007/s11743-000-0113-4

Public

On the measurement of critical micelle concentrations of pure and technical‐grade nonionic surfactants

Published in Journal of Surfactants and Detergents • Jan 1, 2000

Authors:

A. Patist

Sunil S. Bhagwat

Kevin Penfield

Abstract

Abstract The critical micelle concentrations (CMC) of nine commercial nonionic surfactants (Tween 20, 22, 40, 60, and 80; Triton X‐100; Brij 35, 58, and 78) and two pure nonionics [C 12 (EO) 5 and C 12 (EO) 8 ] were determined by surface tension and dye micellization methods. Commercially available ...

Subject

Surface tension

Critical micelle concentration

Wilhelmy plate

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