Origin of efficiency droop in GaN-based light-emitting diodes

Kim, Minho; Schubert, M.; Dai, Qi; Kyu Kim, Jong; Fred Schubert, E.; Piprek, Joachim; Park, Yongjo

doi:10.1063/1.2800290

Public

Origin of efficiency droop in GaN-based light-emitting diodes

Published in Applied Physics Letters • Oct 29, 2007

Authors:

Minho Kim

M. Schubert

Qi Dai

Abstract

The efficiency droop in GaInN∕GaN multiple-quantum well (MQW) light-emitting diodes is investigated. Measurements show that the efficiency droop, occurring under high injection conditions, is unrelated to junction temperature. Furthermore, the photoluminescence output as a function of excitation pow...

Subject

Voltage droop

Light-emitting diode

Optoelectronics

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