Atomic resolution mapping of interfacial intermixing and segregation in InAs/GaSb superlattices: A correlative study

Kim, Honggyu; Meng, Yifei; Rouvière, Jean‐Luc; Isheim, Dieter; N. Seidman, David; Zuo, Jian‐Min

doi:10.1063/1.4794193

Public

Atomic resolution mapping of interfacial intermixing and segregation in InAs/GaSb superlattices: A correlative study

Published in Journal of Applied Physics • Mar 13, 2013

Authors:

Honggyu Kim

Yifei Meng

Jean‐Luc Rouvière

Abstract

We combine quantitative analyses of Z-contrast images with composition analyses employing atom probe tomography (APT) correlatively to provide a quantitative measurement of atomic scale interfacial intermixing in an InAs/GaSb superlattice (SL). Contributions from GaSb and InAs in the Z-contrast imag...

Subject

Superlattice

Atom probe

Materials science

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