Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering
Published in International Journal of Online and Biomedical Engineering (iJOE) • Jul 30, 2009
Authors:,,
Laurent Latorre
Béatrice Pradarelli
Pascal Nouet
Abstract
This paper concerns the local and remote use of an Integrated Circuits (IC) Automated Test Equipment (ATE) for both educational and engineering purposes. This experience was initiated in 1998 in the context of a French network (CNFM) in order to provide a distant control to industrial equipment for ...
Finding related papers...
Discussions
(0)No comments yet
Be the first to share your thoughts!