XPS analysis of thin oxide films on chemically treated aluminum alloy surfaces using a high‐energy Mg/Zr anode

F. Allgeyer, Daniel; H. Pratz, Earl

doi:10.1002/sia.740180702

Public

XPS analysis of thin oxide films on chemically treated aluminum alloy surfaces using a high‐energy Mg/Zr anode

Published in Surface and Interface Analysis • Jul 1, 1992

Authors:

Daniel F. Allgeyer

Earl H. Pratz

Abstract

Abstract A method for determining the aluminum oxide and aluminum metal atomic concentrations on complex aluminum alloy surfaces using a high‐energy Mg/Zr x‐ray source (1253.6 and 2042.4 eV, respectively) was discussed. XPS analysis of chemically processed aluminum surfaces using an Mg or Mg/Al anod...

Subject

X-ray photoelectron spectroscopy

Auger

Aluminium

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