Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

Espinós, J.P.; Morales, J.J.; Barranco, Ángel; Caballero, Alfonso; P. Holgado, Juan; R. González-Elipe, Agustı́n

doi:10.1021/jp014618m

Public

Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

Published in The Journal of Physical Chemistry B • Jun 19, 2002

Authors:

J.P. Espinós

J.J. Morales

Ángel Barranco

Abstract

Copper and copper oxides (Cu 2 O and CuO) have been deposited by evaporation of copper and subsequent oxidizing treatments, on the surface of flat SiO 2 and ZrO 2 substrates. Large variations of several eVs have been found in the values of the Cu 2p 3/2 binding energy (BE) and Auger parameter (α‘) o...

Subject

Copper

X-ray photoelectron spectroscopy

Oxide

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