Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Sarid, Dror; Coratger, R.; Ajustron, F.; Beauvillain, Jacques

doi:10.1051/mmm:0199100206064900

Public

Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Published in Microscopy Microanalysis Microstructures • Jan 1, 1991

Authors:

Dror Sarid

R. Coratger

F. Ajustron

Abstract

PART ONE: LEVERS AND NOISE 1. Mechanical properties of levers 2. Resonance enhancement 3. Sources of noise PART TWO: SCANNING FORCE MICROSCOPES 4. Tunneling detection systems 5. Capacitance detection systems 6. Homodyne detection systems 7. Heterodyne detection systems 8. Laser-Diode feedback detect...

Subject

Non-contact atomic force microscopy

Conductive atomic force microscopy

Scanning probe microscopy

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