Experimental and theoretical analysis of transport properties of core-shell wire light emitting diodes probed by electron beam induced current microscopy.

Lavenus, P; Messanvi, A; Rigutti, L; De Luna Bugallo, A; Zhang, H; Bayle, F; H Julien, F; Eymery, J; Durand, C; Tchernycheva, M

doi:10.1088/0957-4484/25/25/255201

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Experimental and theoretical analysis of transport properties of core-shell wire light emitting diodes probed by electron beam induced current microscopy.

Shared by NobleBlocks on Jun 27, 2014 • 12:00 AM UTC

Authors:

P Lavenus

A Messanvi

L Rigutti

Abstract

We report a systematic experimental and theoretical investigation of core-shell InGaN/GaN single wire light-emitting diodes (LEDs) using electron beam induced current (EBIC) microscopy. The wires were grown by catalyst-free MOVPE and processed into single wire LEDs using electron beam lithography on...

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