Experimental and theoretical analysis of transport properties of core–shell wire light emitting diodes probed by electron beam induced current microscopy

Lavenus, Pierre; Messanvi, A.; Rigutti, L; de Luna Bugallo, Andrés; Zhang, Haiyan; Bayle, Fabien; H Julien, F; Eymery, J.; Durand, C.; Tchernycheva, Maria

doi:10.1088/0957-4484/25/25/255201

Public

Experimental and theoretical analysis of transport properties of core–shell wire light emitting diodes probed by electron beam induced current microscopy

Published in Nanotechnology • Jun 4, 2014

Authors:

Pierre Lavenus

A. Messanvi

L Rigutti

Abstract

We report a systematic experimental and theoretical investigation of core-shell InGaN/GaN single wire light-emitting diodes (LEDs) using electron beam induced current (EBIC) microscopy. The wires were grown by catalyst-free MOVPE and processed into single wire LEDs using electron beam lithography on...

Subject

Materials science

Diode

Light-emitting diode

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