Circular bist testing the digital logic within a high speed serdes | NobleBlocks
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Circular bist testing the digital logic within a high speed serdes
Published • Jul 8, 2004
Authors:
G. Hetherington
,
Richard Simpson
Abstract
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BlST for testing the digital part of a serdes using circular BET.
