2016 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and its applications

West, Margaret; T. Ellis, Andrew; J. Potts, Philip; Streli, Christina; Vanhoof, Christine; Wobrauschek, P.

doi:10.1039/c6ja90034h

Public

2016 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and its applications

Published in Journal of Analytical Atomic Spectrometry • Jan 1, 2016

Authors:

Margaret West

Andrew T. Ellis

Philip J. Potts

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Subject

X-ray fluorescence

Mass spectrometry

Synchrotron

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