<i>In situ</i>XPS analysis of various iron oxide films grown by<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">NO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>-assisted molecular-beam epitaxy

Fujii, Tatsuo; M. F. de Groot, Frank; A. Sawatzky, G.; C. Voogt, F.; Hibma, T.; Okada, Kozo

doi:10.1103/physrevb.59.3195

Public

In situXPS analysis of various iron oxide films grown byNO2-assisted molecular-beam epitaxy

Published in Physical review. B, Condensed matter • Jan 15, 1999

Authors:

Tatsuo Fujii

Frank M. F. de Groot

G. A. Sawatzky

Abstract

We report on a systematic analysis of x-ray photoelectron spectroscopy (XPS) core- and valence-level spectra of clean and well-characterized iron oxide films, i.e., $\ensuremath{\alpha}\ensuremath{-}{\mathrm{Fe}}_{2}{\mathrm{O}}_{3},$ $\ensuremath{\gamma}\ensuremath{-}{\mathrm{Fe}}_{2}{\mathrm{O}}_{...

Subject

X-ray photoelectron spectroscopy

Crystallography

Physics

Finding related papers...

Discussions

(0)

No comments yet

Be the first to share your thoughts!