Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

Hellebrand, Sybille; Rajski, Janusz; Tarnick, Steffen; Venkataraman, S.; Courtois, B.

doi:10.1109/12.364534

Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers | NobleBlocks