XRD Measurement of Mean Crystallite Thickness of Illite and Illite/Smectite: Reappraisal of the Kubler Index and the Scherrer Equation

A. Drits, Victor; Środoń, Jan; D. Eberl, D.

doi:10.1346/ccmn.1997.0450315

Public

XRD Measurement of Mean Crystallite Thickness of Illite and Illite/Smectite: Reappraisal of the Kubler Index and the Scherrer Equation

Published in Clays and Clay Minerals • Jun 1, 1997

Authors:

Victor A. Drits

Jan Środoń

D. D. Eberl

Abstract

Abstract The standard form of the Scherrer equation, which has been used to calculate the mean thickness of the coherent scattering domain (CSD) of illite crystals from X-ray diffraction (XRD) full width data at half maximum (FWHM) intensity, employs a constant, K sh , of 0.89. Use of this constant ...

Subject

Illite

Scherrer equation

Crystallite

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