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Structures, mobilities, electronic and magnetic properties of point defects in silicene.

Published in Nanoscale • Oct 21, 2013
Authors:
Junfeng Gao
,
Junfeng Zhang
,
Hongsheng Liu

Abstract

In the fabrication and processing of silicene monolayers, structural defects are almost inevitable. Using ab initio calculations, we systemically investigated the structures, formation energies, migration behaviors and electronic/magnetic properties of typical point defects in silicene, including th...

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