Error-Related EEG Potentials Generated During Simulated Brain–Computer Interaction

W. Ferrez, Pierre; del R. Millán, José

doi:10.1109/tbme.2007.908083

Public

Error-Related EEG Potentials Generated During Simulated Brain–Computer Interaction

Published in IEEE Transactions on Biomedical Engineering • Feb 21, 2008

Authors:

Pierre W. Ferrez

José del R. Millán

Abstract

Brain-computer interfaces (BCIs) are prone to errors in the recognition of subject's intent. An elegant approach to improve the accuracy of BCIs consists in a verification procedure directly based on the presence of error-related potentials (ErrP) in the electroencephalogram (EEG) recorded right aft...

Subject

Brain–computer interface

Electroencephalography

Computer science

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