EM-Based Monte Carlo Analysis and Yield Prediction of Microwave Circuits Using Linear-Input Neural-Output Space Mapping

E. Rayas‐Sánchez, José; Gutiérrez-Ayala, Vladimir

doi:10.1109/tmtt.2006.885902

Public

EM-Based Monte Carlo Analysis and Yield Prediction of Microwave Circuits Using Linear-Input Neural-Output Space Mapping

Published in IEEE Transactions on Microwave Theory and Techniques • Dec 1, 2006

Authors:

José E. Rayas‐Sánchez

Vladimir Gutiérrez-Ayala

Abstract

A computationally efficient method for highly accurate electromagnetics-based statistical analysis and yield estimation of RF and microwave circuits is described in this paper. The statistical analysis is realized around a space-mapped nominal solution. Our method consists of applying a constrained ...

Subject

Space mapping

Artificial neural network

Monte Carlo method

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