Performance and Reliability Features of Advanced Nonvolatile Memories Based on Discrete Traps (Silicon Nanocrystals, SONOS)

DeSalvo, B.; Gerardi, C.; vanSchaijk, R.; Lombardo, S.; Corso, D.; Plantamura, C.; Serafino, S.; Ammendola, G.; vanDuuren, M.; Goarin, P.; Yuet Mei, Wan; vanderJeugd, K.; Baron, T.; Gély, M.; Mur, P.; Deleonibus, S.

doi:10.1109/tdmr.2004.837209

Public

Performance and Reliability Features of Advanced Nonvolatile Memories Based on Discrete Traps (Silicon Nanocrystals, SONOS)

Published in IEEE Transactions on Device and Materials Reliability • Sep 1, 2004

Authors:

B. DeSalvo

C. Gerardi

R. vanSchaijk

Abstract

In this paper, an overview of today's status and progress, as well as tomorrow's challenges and trends, in the field of advanced nonvolatile memories based on discrete traps is given. In particular, unique features of silicon nanocrystal and SONOS memories will be illustrated through original recent...

Subject

Non-volatile memory

Reliability (semiconductor)

Silicon

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