Transformation invariance in pattern recognition: Tangent distance and propagation

Y. Simard, Patrice; A. Le Cun, Yann; S. Denker, John; Victorri, Bernard

doi:10.1002/1098-1098(2000)11:3<181::aid-ima1003>3.0.co;2-e

Public

Transformation invariance in pattern recognition: Tangent distance and propagation

Published in International Journal of Imaging Systems and Technology • Jan 1, 2000

Authors:

Patrice Y. Simard

Yann A. Le Cun

John S. Denker

Abstract

In pattern recognition, statistical modeling, or regression, the amount of data is a critical factor affecting the performance. If the amount of data and computational resources are unlimited, even trivial algorithms will converge to the optimal solution. However, in the practical case, given limite...

Subject

Transformation (genetics)

Computer science

Invariance principle

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