Analysis of different measurement setups for a programmable josephson voltage standard

Behr, R.; Kohlmann, J.; Janssen, Jochem; Kleinschmidt, Peter; Williams, J.M.; Djordjevic, S.; Lo-Hive, J.-P.; Piquemal, François; Hetland, P.O.; Reymann, D.; Eklund, Gunnar; Hof, C.; Jeanneret, B.; Chevtchenko, O.A.; Houtzager, Ernest; E. van den Brom, Helko; Sosso, A.; Andreone, D.; Nissilä, J.; Helist, P.

doi:10.1109/tim.2003.811570

Public

Analysis of different measurement setups for a programmable josephson voltage standard

Published in IEEE Transactions on Instrumentation and Measurement • Apr 1, 2003

Authors:

R. Behr

J. Kohlmann

Jochem Janssen

Abstract

The electrical characteristics of two different 1-V binary programmable Josephson arrays, an superconductor/insulator/normal conductor/insulator/superconductor-type Josephson array, and an externally shunted superconductor/insulator/superconductor-type Josephson array, were investigated at ten metro...

Subject

Josephson effect

Voltage

Insulator (electricity)

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