Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
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Shared by NobleBlocks on Jun 12, 2009 • 12:00 AM UTC
Authors:
Maria Losurdo
,
Michael Bergmair
,
Giovanni Bruno
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Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives | NobleBlocks
