Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode

Hodoroaba, V-D; Rades, Steffi; Salge, T.; Mielke, Johannes; Ortel, Erik; Schmidt, R.

doi:10.1088/1757-899x/109/1/012006

Public

Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode

Published in IOP Conference Series Materials Science and Engineering • Feb 9, 2016

Authors:

V-D Hodoroaba

Steffi Rades

T. Salge

Abstract

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd.

Subject

Scanning electron microscope

Materials science

Nanoparticle

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