Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

Dvorak, Joseph; Jarrige, Ignace; Bisogni, Valentina; Coburn, S.; Leonhardt, W.

doi:10.1063/1.4964847

Public

Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

Published in Review of Scientific Instruments • Nov 1, 2016

Authors:

Joseph Dvorak

Ignace Jarrige

Valentina Bisogni

Abstract

We present the optical design of the Centurion soft X-ray resonant inelastic X-ray scattering (RIXS) spectrometer to be located on the SIX beamline at NSLS-II. The spectrometer is designed to reach a resolving power of 100 000 at 1000 eV at its best resolution. It is also designed to have continuous...

Subject

Spectrometer

Beamline

Physics

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