Accurate Extraction of Charge Carrier Mobility in 4‐Probe Field‐Effect Transistors

Ho Choi, Hyun; Rodionov, Yaroslav; F. Paterson, Alexandra; Panidi, Julianna; Saranin, D.; Kharlamov, Nikolai; Didenko, S.; D. Anthopoulos, Thomas; Cho, Kilwon; Podzorov, Vitaly

doi:10.1002/adfm.201707105

Public

Accurate Extraction of Charge Carrier Mobility in 4‐Probe Field‐Effect Transistors

Published in Advanced Functional Materials • Apr 30, 2018

Authors:

Hyun Ho Choi

Yaroslav Rodionov

Alexandra F. Paterson

Abstract

Abstract Charge carrier mobility is an important characteristic of organic field‐effect transistors (OFETs) and other semiconductor devices. However, accurate mobility determination in FETs is frequently compromised by issues related to Schottky‐barrier contact resistance, that can be efficiently ad...

Subject

Materials science

Electron mobility

Schottky barrier

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