Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi>MnBi</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mrow><mml:mi>Te</mml:mi></mml:mrow><mml:mrow><mml:mn>4</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math> Films

M. Otrokov, M.; P. Rusinov, I.; Blanco-Rey, M.; Hoffmann, Martin; Yu. Vyazovskaya, A.; V. Eremeev, S.; Ernst, A.; M. Echenique, P.; Arnau, A.; V. Chulkov, Eugene

doi:10.1103/physrevlett.122.107202

Public

Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films

Published in Physical Review Letters • Mar 13, 2019

Authors:

M. M. Otrokov

I. P. Rusinov

M. Blanco-Rey

Abstract

Using density functional theory and Monte Carlo calculations, we study the thickness dependence of the magnetic and electronic properties of a van der Waals interlayer antiferromagnet in the two-dimensional limit. Considering MnBi_{2}Te_{4} as a model material, we find it to demonstrate a remarkable...

Subject

van der Waals force

Antiferromagnetism

Condensed matter physics

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