Analysis of Field Degradation Rates Observed in All-India Survey of Photovoltaic Module Reliability 2018

Rao Golive, Yogeswara; Zachariah, Sachin; Dubey, Rajiv; Chattopadhyay, Shashwata; Bhaduri, S.; Kumar Singh, Hemant; Bora, Birinchi; Kumar, Sanjay; Kumar Tripathi, Arun; Kottantharayil, Anil; Vasi, J.; Shiradkar, Narendra

doi:10.1109/jphotov.2019.2954777

Public

Analysis of Field Degradation Rates Observed in All-India Survey of Photovoltaic Module Reliability 2018

Published in IEEE Journal of Photovoltaics • Dec 10, 2019

Authors:

Yogeswara Rao Golive

Sachin Zachariah

Rajiv Dubey

Abstract

The analysis of performance degradation in photovoltaic (PV) modules with c-Si technologies as observed in the All-India Survey of PV Module Reliability 2018 is presented in this article. The degradation rates are correlated with the module age, system size, mounting configuration, and climate of de...

Subject

Degradation (telecommunications)

Photovoltaic system

Reliability (semiconductor)

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