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Quantum metrology.

Published in Physical review letters • Jan 13, 2006
NobleIDNI9P40W52R87S97
Authors:
Vittorio Giovannetti
,
Seth Lloyd
,
Lorenzo Maccone

Abstract

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove t...

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