Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Zintler, Alexander; Eilhardt, Robert; Wang, Shuai; Krajňák, Matúš; Schramowski, Patrick; Stammer, Wolfgang; Petzold, Stefan; Kaiser, Nico; Kersting, Kristian; Alff, Lambert; Molina‐Luna, Leopoldo

doi:10.1017/s1431927620019790

Public

Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Published in Microscopy and Microanalysis • Jul 30, 2020

Authors:

Alexander Zintler

Robert Eilhardt

Shuai Wang

Abstract

Alexander Zintler, Robert Eilhardt, Shuai Wang, Matus Krajnak, Patrick Schramowski, Wolfgang Stammer, Stefan Petzold, Nico Kaiser, Kristian Kersting, Lambe

Subject

Matching (statistics)

Materials science

Phase (matter)

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