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Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
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Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
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Shared by
NobleBlocks
on Sep 12, 2021 • 12:00 AM UTC
Authors:
S. Veljković
,
N. Mitrovic
,
S. Djorić-Veljković
+9 more
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Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors | NobleBlocks
