2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

West, Margaret; T. Ellis, Andrew; Streli, Christina; Vanhoof, Christine; Wobrauschek, P.

doi:10.1039/c7ja90035j

Public

2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

Published in Journal of Analytical Atomic Spectrometry • Jan 1, 2017

Authors:

Margaret West

Andrew T. Ellis

Christina Streli

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Subject

X-ray fluorescence

Mass spectrometry

Synchrotron

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