2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

West, Margaret; T. Ellis, Andrew; J. Potts, Philip; Streli, Christina; Vanhoof, Christine; Wobrauschek, P.

doi:10.1039/c5ja90033f

Public

2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

Published in Journal of Analytical Atomic Spectrometry • Jan 1, 2015

Authors:

Margaret West

Andrew T. Ellis

Philip J. Potts

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Subject

X-ray fluorescence

Mass spectrometry

Synchrotron

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